We provide a ICP-MS designed for maximum interference removal and superior BEC down to single-digit ppt.

PerkinElmer’s NexION? 350 ICP-MS sectrometers provide superior uptime and productivity through a variety of unique features that make them the analytical instruments of choice in the semiconductor industry. Enhanced signal stability, speed, and the lowest detection limits of any ICP-MS on the market are just some of the reasons why the NexION is the industry leader. Now consider that the NexION is designed for maximum interference removal and also offers the most advanced nanoparticle software for single particle analysis down to the sub-20 nanometer diameter, and you will know why NexION leads the ICP-MS pack.

Utilizing systems designed exclusively for the semiconductor market testing needs, all turnkey methods, as well as samples analyzed for customer's evaluation, are performed in our class 100 semiconductor clean rooms. These facilities allow us to anticipate the needs of the rigorous analysis that will be expected once installed in your facility. Our goal is to provide your laboratory with the analytical systems and appropriate support to help your laboratory obtain the lowest possible detection limits as rapidly and easily as possible.

PerkinElmer offers a full spectrum of instruments, products, and services for the semiconductor laboratory, including:

  • Atomic Spectroscopy (GFAAS, ICP-MS and ICP-OES)
  • Chromatography (Thermal Desorption, GC, GC/MS, HPLC/UHPLC)
  • Molecular Spectroscopy (FT-IR and UV-Vis)
  • Thermal and Elemental Analysis
  • Consumables
  • Service offerings, including turnkey maintenance agreements

Impurities Management

Determine ultra-trace metal contaminates during the manufacturing process of electronics and semiconductors using the NexION 350S ICP-MS.

  • The NexION 350S ICP-MS features a dual-channel Universal Cell that is optimized for sensitivity. The system uses pure reactive gases to remove all interferences with little or no loss of analyte sensitivity. It is ideal for applications that demand the very best performance and an unprecedented level of interference removal. In addition, the configuration of the NexION 350S ICP-MS is designed specifically to meet the needs of the semiconductor industry.

Determination of impurities in IPA using Automated Thermal Desorption-GC/MS.

  • The PerkinElmer Automated Thermal Desorption-GC/MS provides an ideal, complete, solution to detecting ultra-trace elements in Isopropyl Alcohol (IPA).

Easy determination and identification of impurities using the PerkinElmer Spotlight? 400 FT-IR Imaging System.

  • The PerkinElmer Spotlight? FT-IR provides the ability to measure impurities in semiconductors at ?, offering fast and effective quality control.

Components Quality

Safeguard the quality of a wide variety of semiconductor and other electronic materials using PerkinElmer materials characterization solutions.

Thermal analyzers are an essential tool in the semiconductor packaging industry. Not only are they important in the design and development phase, but they can also be used for failure analysis and quality control purposes.

PerkinElmer’s family of FT-IR spectrometers offers a full suite of solutions for the semiconductor industry. Knowledge of impurities like carbon, oxygen, boron, and phosphorus in wafers and cells is essential to the future manufacturing process and for cell efficiency. The concentration of these elements directly impacts the wafer fabrication process in the semiconducting layers and therefore influences reliability. Infrared spectroscopy (FT-IR) is used for this application because of its ability to visualize different types of bonding between atoms and their activity under very specific conditions.

PerkinElmer’s high-performance LAMBDA? UV/Vis/NIR spectrophotometers, accessories, and software are ideals choices for providing accurate measurement of key research parameters, such as band gap. This property is important for determining the quality of semiconducting elements used in the production of thin-film PV cells.


Workplace Safety and Material Outgassing

The PerkinElmer family of chromatographic systems provides complete solutions for the analysis of toxic chemicals in microchip fabrication plants (Fabs) and other semiconductor workplaces.

PerkinElmer also provides solutions for the analysis of toxic chemicals emitted from smokestacks using a variety of detectors, including thermal desorption coupled with GC/MS.The TurboMatrix ATD/GC/MS system is also ideal for measuring the toxic component in workplace air. Thermal desorption is a technique that simplifies and speeds a wide range of gas chromatography (GC) applications, including cleanroom air monitoring, and the analysis of outgassing from semiconductor materials, and polymers. The systems twin-walled oven design with concentric air exhaust allows the user to achieve greater separation at near-ambient temperatures without the use of special coolants, especially important for the analysis of Volatile Organic Compounds (VOCs) in Fab environmental monitoring.


Nanoscale Detection and Characterization

For improved QA/QC at the nanoscale, PerkinElmer offers a suite of analytical techniques. The NexION 350 equipped with the Syngistix? Nano Application Module is capable of identifying, counting, and sizing particles from sub-10 nanometers up to a few micrometers at the single particle level. The LAMBDA? 1050 UV/VIS with its diverse accessories offers insights to the surface chemistry.

Nanomaterials are used in the construction of polymer-based photovoltaic (PV) cells to aid the charge transfer from the light-sensitive organic material to the conducting layer of the solar cell.

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"半导体/电子" 1-3939 产品与服务


Avio 200 电感耦合等离子体发射光谱仪

PerkinElmer 全新的 Avio? 200 是一款垂直炬管设计的紧凑型ICP-OES,可应对基体极为复杂的样品,无需手工稀释直接进样,性能超群,简单易用。

PinAAcle 900T 原子吸收光谱仪

PinAAcle? 900T是一款顶级的实验室用火焰/石墨炉原子吸收光谱仪(AA),火焰/石墨炉一体化设计,带有纵向塞曼背景扣除系统。

PinAAcle 900Z 原子吸收光谱仪

PinAAcle? 900Z是一款高性能实验室用单石墨炉原子吸收光谱仪(AA),带有纵向塞曼背景扣除系统,双光束设计,超快启动速度,超高长期稳定性。
Avio 500 ICP-OES Front Elevated

Avio 500 电感耦合等离子体发射光谱仪

真正全谱直读,高灵敏度、高分辨率的Avio 500让您实验室的每分钱投入都获得最大的回报,即使最困难的样品也能应付自如。Avio 500拥有:垂直炬管设计带来的卓越基体耐受力;所有ICP发射光谱仪中最低的氩气消耗,比任何其他同类仪器节约氩气50%以上;实时扣背景功能,测样速度更快,结果准确度更高;双向观测技术、全谱直读和低维护要求带来的更高仪器使用效率。

同步热分析仪 (STA) 6000

The STA 6000 同步热分析仪可提供您可以依赖的性能,可靠性和生产力。

DSC 6000


DSC 4000 系统, 100-240V/50-60Hz

Spectrum Two IR Spectrometer

Spectrum Two FT-IR Spectrometer

Easy to use, powerful, compact and robust – Spectrum Two? is the FT-IR spectrometer of choice for everyone, everywhere. With fully integrated, robust universal sampling for trouble-free measurements and portability options, Spectrum Two is ideal for use in both laboratory and remote testing environments. Ideally suited to everyday analysis, you can confidently perform fast, accurate IR analysis and assure the quality of your materials across a wide range of applications.
Clarus 690 GC

Clarus 690 气相色谱

全新Clarus 690 气相色谱专为那些需要提高分析效率的实验室而设计,提供了优异的灵敏度和实验效率,可以处理更多的样品。Clarus 690 气相色谱轻松集成了最多样的样品处理系统供用户选择,包括TurboMatrix?顶空,手动或自动热解析和多功能自动进样系统。

LAMBDA 365 紫外/可见分光光度计

LAMBDA? 365 提供艺术级的紫外/可见性能,满足制药行业,分析化学家,遗传学家和制造QA/QC分析家的需求。21 CFR part 11 合规软件可选,该系统可以支持从标准方法和应用到法规符合的所有工作。
DMA 8000 N5330101


DMA 8000的创新型设计、高效灵活的操作使之成为材料研究开发和生产线质量控制的理想仪器??晒惴河τ糜诰酆衔?、复合材料、制药以及食品行业。

Spotlight 200i 红外显微系统

Spotlight 200i 红外显微系统是一个高性能的显微镜平台,旨在使各种样品得到高质量可重复的数据。

LAMBDA 750 紫外/可见/近红外分光光度计

LAMBDA 750 设计用于提供最大采样灵活性,以便测定化学,生化和材料科学方面困难的样品。
Frontier MIR/NIR + SP10 STD


Frontier? IR/FIR中远红外一体系统联合了中红外和远红外区域最佳的性能,让您能够很容易将这套系统应用于您严格的科研需求中。

LS 45 (120V)

PerkinElmer LS 45为多功能、可靠和易用的分光光度计。
Simultaneous Thermal Analyzer (STA) 8000

同步热分析仪 (STA) 8000

STA 8000同步热分析仪可提供您可以依赖的性能,可靠性和生产力。



LAMBDA 465 紫外/可见分光光度计

LAMBDA? 465系统专为高端研究、常规和高通量应用设计,该系统采用创新的PDA方案,数据高度可靠,值得信赖。

Spotlight 150i 傅里叶变换红外显微系统

Spotlight 150i FT-IR显微镜系统具有最高性能和高灵敏度,可实现点分析和拍摄功能,并且操作简单,重复性好,是分析服务实验室,生产故障排除,刑侦和科研实验室的理想选择。


50年来,PerkinElmer一直处于研究和创新的前沿。现在,集多年的经验,PerkinElmer推出了LAMBDA XLS+ 分光光度计,该系统可以满足您繁忙实验室的需求。

LAMBDA 265 紫外/可见分光光度计

LAMBDA? 265系统具有超快速数据采集能力和最高的可靠性,并且占用空间最小,是广泛R&D和QA/QC应用的理想系统。

LAMBDA 1050 紫外/可见/近红外分光光度计

LAMBDA 1050 为迄今 PerkinElmer 最高性能的紫外/可见/近红外分光光度计。

LS 45 (230V)

LS 45荧光光谱仪提供多功能、可靠、易用的常规分析包。
LAMBDA UV/Vis Spectrophotometer

LAMBDA 650 紫外/可见分光光度计

LAMBDA 650系统波长范围为190~900 nm,高性能,可升级,灵活,价格划算。

TMA 4000 实验室系统, 100-230V

PerkinElmer公司的TMA 4000是一款设计简洁、使用方便、稳固耐用的热机械分析仪,非常适合于精确测量微型元器件/材料的膨胀系数(CTE)等应用领域。
Frontier MIR/NIR + SP10 STD


Torin T-9

Torion T-9 Portable GC/MS

PerkinElmer 提供可进行现场检测的便携式GC/MS,该仪器对于快速化合物的筛查非常理想,包括环境挥发物和半挥发物(VOCs/SVOCs),爆炸物,化学武器成分,有害物质等,同样在食品安全和工业中也有应用。



LS 55 (230V)


LAMBDA 850 紫外/可见分光光度计

LAMBDA 850 为 PerkinElmer 最高性能的紫外/可见系统。
Spotlight 400 FT-IR Imaging System

Spotlight 400 红外成像系统

The Spotlight 400 FTIR Imaging System combines high sensitivity and rapid imaging with ease-of-use. The ability to image rapidly large sample areas at high spacial resolution (down to 10 microns) extends IR microscopy into new applications.
LAMBDA Spectrophotometers

LAMBDA 950 紫外/可见/近红外分光光度计

LAMBDA 950 为 PerkinElmer 高性能紫外/可见/近红外系统之一。

TGA 8000


DSC 8000

DSC 8000特有的双炉体技术,直接测量两个独立炉体之间热流变化,可在全程温度范围得到非常准确的能量数据,从而满足您在科研方面的高级需求。
Frontier MIR/NIR + SP10 STD

Frontier MIR + SP10 STD

Frontier? 中红外系统是最理想的实验室傅里叶红外光谱仪,提供多种取样附件,灵活性高,标配大气补偿功能,可升级至显微镜系统并提供一系列软件包,包括Quantitative和21 CFR part 11合规软件。

TGA 4000 N5370210

TGA 4000 系统, 100-240V/50-60Hz

TGA 4000 炉体采用集约式陶瓷设计,温度控制准确度和精度更高。其陶瓷炉体耐化学腐蚀性优异,适用于多种活性气体气氛,可充分拓展您的研究领域。
LS 55 (120V)

LS 55 (120V)

Clarus SQ 8 GC/MS

Clarus SQ 8 GC/MS

Our Clarus? SQ 8 GC/MS offers unsurpassed sensitivity and unparalleled stability for identification and quantitation of volatile and semi-volatile compounds (VOC and SVOC). It's designed to deliver high throughput, rugged dependability, and great results. Plus, with our patented SMARTsource? (for both EI and CI), maintenance is easy.

TurboMatrix 650 ATD

Incorporates PPC for enhanced ease-of-use, functionality and performance in an automated sample-tube handling system for unattended analysis of up to 50 samples. Concurrent desorption of the next sample while the current sample is undergoing GC analysis optimizes productivity.

"半导体/电子" 1-3939 产品与服务

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